Invention Grant
- Patent Title: Mass spectrometric analyzer
- Patent Title (中): 质谱仪
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Application No.: US13140346Application Date: 2009-12-22
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Publication No.: US08294085B2Publication Date: 2012-10-23
- Inventor: Li Ding
- Applicant: Li Ding
- Applicant Address: CN Shanghai
- Assignee: Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Current Assignee: Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Current Assignee Address: CN Shanghai
- Agency: Morris Manning & Martin LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: CN200810207492 20081222
- International Application: PCT/CN2009/075813 WO 20091222
- International Announcement: WO2010/072137 WO 20100701
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/26 ; B01D59/44

Abstract:
A mass spectrometric analyzer and an analysis method based on the detection of ion image current are provided. The method in one embodiment includes using electrostatic reflectors or electrostatic deflectors to enable pulsed ions to move periodically for multiple times in the analyzer, forming time focusing in a portion of the ion flight region thereof, and forming an confined ion beam in space; enabling the ion beam to pass through multiple tubular image current detectors arranged in series along an axial direction of the ion beam periodically, using a low-noise electronic amplification device to detect image currents picked up by the multiple tubular detectors differentially, and using a data conversion method, such as a least square regression, to acquire a mass spectrum.
Public/Granted literature
- US20110240845A1 MASS ANALYZER Public/Granted day:2011-10-06
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