发明授权
US08300976B2 System and method for adjusting backlight in measurement of a profile image
有权
用于在轮廓图像的测量中调整背光的系统和方法
- 专利标题: System and method for adjusting backlight in measurement of a profile image
- 专利标题(中): 用于在轮廓图像的测量中调整背光的系统和方法
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申请号: US12344252申请日: 2008-12-25
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公开(公告)号: US08300976B2公开(公告)日: 2012-10-30
- 发明人: Chih-Kuang Chang , Xian-Yi Chen , Zhong-Kui Yuan , Li Jiang
- 申请人: Chih-Kuang Chang , Xian-Yi Chen , Zhong-Kui Yuan , Li Jiang
- 申请人地址: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- 专利权人: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- 代理机构: Altis Law Group, Inc.
- 优先权: CN200810302252 20080620
- 主分类号: G06K9/40
- IPC分类号: G06K9/40
摘要:
A computer-implemented method for adjusting backlight in measurement of a profile image of an object includes setting a light source of an image measuring machine to an original intensity level, obtaining the profile image of the object laid on the image measuring machine, and performing a mean filter processing and a binary image processing on the profile image. The method further includes setting intensity variables to adjust backlight intensity of the light source, uses the intensity variables to calculate an optimum intensity level of the backlight intensity utilizing an iterative method, and adjusting the backlight intensity of the light source to the optimum intensity level to obtain an optimum profile image of the object.
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