发明授权
US08301409B2 Photon imaging system for detecting defects in photovoltaic devices, and method thereof
有权
用于检测光伏器件中的缺陷的光子成像系统及其方法
- 专利标题： Photon imaging system for detecting defects in photovoltaic devices, and method thereof
- 专利标题（中）： 用于检测光伏器件中的缺陷的光子成像系统及其方法
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申请号： US12645802申请日： 2009-12-23
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公开(公告)号： US08301409B2公开(公告)日： 2012-10-30
- 发明人: Faisal Razi Ahmad , Oleg Sulima , Kaustubh Ravindra Nagarkar , Ri-an Zhao , James William Bray
- 申请人： Faisal Razi Ahmad , Oleg Sulima , Kaustubh Ravindra Nagarkar , Ri-an Zhao , James William Bray
- 申请人地址： US NY Niskayuna
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： US NY Niskayuna
- 代理商 Paul J. DiConza
- 主分类号： G01R29/00
- IPC分类号： G01R29/00 ; G06F11/00
摘要：
A method includes supplying current to at least one photovoltaic device via a current source and detecting emitted photon radiations from the at least one photovoltaic device via a radiation detector. The method also includes outputting a signal corresponding to the detected emitted photon radiations from the radiation detector to a processor device, and processing the signal corresponding to the detected emitted photon radiations via the processor device to generate one or more two-dimensional photon images. The method further includes analyzing the one or more two-dimensional photon images to determine at least one defect in the at least one photovoltaic device.
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