发明授权
- 专利标题: Radiation detecting apparatus and radiation detecting system
- 专利标题(中): 辐射检测装置及辐射检测系统
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申请号: US12528580申请日: 2008-04-09
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公开(公告)号: US08304735B2公开(公告)日: 2012-11-06
- 发明人: Masato Inoue , Satoshi Okada , Shinichi Takeda , Kazumi Nagano , Keiichi Nomura , Satoru Sawada
- 申请人: Masato Inoue , Satoshi Okada , Shinichi Takeda , Kazumi Nagano , Keiichi Nomura , Satoru Sawada
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2007-109469 20070418; JP2008-083387 20080327
- 国际申请: PCT/JP2008/057374 WO 20080409
- 国际公布: WO2008/133123 WO 20081106
- 主分类号: G01J5/28
- IPC分类号: G01J5/28
摘要:
To reduce peeling between members constituting an radiation detecting apparatus, the radiation detecting apparatus of the present invention includes a laminating layered structure in which a supporting substance, an adhesive layer, an array substrate having a photoelectric conversion element, a scintillator layer for converting a radiation into light and a resin layer are stacked in this order. Of arrangement regions of each layer in a plane direction, an arrangement region of the scintillator layer is broader than the region opposed to a photoelectric conversion element, and an arrangement region of the adhesive layer is the same as or broader than the arrangement region of the photoelectric conversion element and at least a portion of the arrangement region of the adhesive layer is narrower than that of the scintillator layer.
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