发明授权
- 专利标题: Method and apparatus of forming a gate
- 专利标题(中): 形成门的方法和装置
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申请号: US12701656申请日: 2010-02-08
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公开(公告)号: US08304831B2公开(公告)日: 2012-11-06
- 发明人: Ming Zhu , Lee-Wee Teo , Han-Guan Chew , Harry Hak-Lay Chuang
- 申请人: Ming Zhu , Lee-Wee Teo , Han-Guan Chew , Harry Hak-Lay Chuang
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: H01L29/66
- IPC分类号: H01L29/66
摘要:
The present disclosure provides a semiconductor device having a transistor. The transistor includes a substrate and first and second wells that are disposed within the substrate. The first and second wells are doped with different types of dopants. The transistor includes a first gate that is disposed at least partially over the first well. The transistor further includes a second gate that is disposed over the second well. The transistor also includes source and drain regions. The source and drain regions are disposed in the first and second wells, respectively. The source and drain regions are doped with dopants of a same type.
公开/授权文献
- US20110193161A1 METHOD AND APPARATUS OF FORMING A GATE 公开/授权日:2011-08-11
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