发明授权
- 专利标题: Particulate matter detection device
- 专利标题(中): 颗粒物检测装置
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申请号: US12701774申请日: 2010-02-08
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公开(公告)号: US08305087B2公开(公告)日: 2012-11-06
- 发明人: Takashi Egami , Takeshi Sakuma , Masahiro Tokuda , Atsuo Kondo
- 申请人: Takashi Egami , Takeshi Sakuma , Masahiro Tokuda , Atsuo Kondo
- 申请人地址: JP Nagoya
- 专利权人: NGK Insulators, Ltd.
- 当前专利权人: NGK Insulators, Ltd.
- 当前专利权人地址: JP Nagoya
- 代理机构: Burr & Brown
- 优先权: JP2009-058856 20090312
- 主分类号: G01N27/62
- IPC分类号: G01N27/62 ; G01N27/00 ; G01F13/00
摘要:
A particulate matter detection device including a first electrode having one surface covered with a dielectric material; a second electrode which is disposed on the side of the one surface of the first electrode via a space where a gas including particulate matter flows and which performs one or both of the formation of a discharge and an electric field by a voltage applied between the first electrode and the second electrode; a pair of measurement electrodes disposed on the surface of the dielectric material so as to face each other; and a protective film disposed on the surfaces of the pair of measurement electrodes and having a volume resistivity of 10 Ωcm to 1012 Ωcm, where the variate of the electric properties between the pair of measurement electrodes is measured, and the amount of the collected particulate matter can be obtained.
公开/授权文献
- US20100229629A1 PARTICULATE MATTER DETECTION DEVICE 公开/授权日:2010-09-16
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