发明授权
US08305542B2 Thin film transistor array substrate with improved test terminals
有权
具有改进测试端子的薄膜晶体管阵列基板
- 专利标题: Thin film transistor array substrate with improved test terminals
- 专利标题(中): 具有改进测试端子的薄膜晶体管阵列基板
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申请号: US13180287申请日: 2011-07-11
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公开(公告)号: US08305542B2公开(公告)日: 2012-11-06
- 发明人: Dong Woo Kang , Soung Yeoul Eom , Bong Chul Kim , Ki Soub Yang
- 申请人: Dong Woo Kang , Soung Yeoul Eom , Bong Chul Kim , Ki Soub Yang
- 申请人地址: KR Seoul
- 专利权人: LG Display Co., Ltd.
- 当前专利权人: LG Display Co., Ltd.
- 当前专利权人地址: KR Seoul
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: KR10-2005-0080149 20050830
- 主分类号: G02F1/1345
- IPC分类号: G02F1/1345
摘要:
A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.
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