Invention Grant
- Patent Title: Defect detection design
- Patent Title (中): 缺陷检测设计
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Application No.: US13235658Application Date: 2011-09-19
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Publication No.: US08315132B1Publication Date: 2012-11-20
- Inventor: Shaohua Yang , Hongwei Song , Zining Wu , Xueshi Yang , Hongxin Song
- Applicant: Shaohua Yang , Hongwei Song , Zining Wu , Xueshi Yang , Hongxin Song
- Applicant Address: BM Hamiltom
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamiltom
- Main IPC: G11B15/52
- IPC: G11B15/52

Abstract:
A system and method are provided to detect defects in a data storage medium by sampling data read from the data storage medium. Time referenced samples of data read from the data storage medium are equalized to mediate the effects of channel noise and the equalized samples are decoded by a decoder, such as a Viterbi decoder. The decoded signal is then reconstructed through a reconstruction filter to approximate the equalized signal. The equalized data signal and the reconstructed data signal are then combined and compared in a bit-by-bit deconstruction scheme to determine, based on a variation between the signal elements, that a defect exists on the data storage medium. Additional action is then taken to mediate the effects of attempting to process corrupted data based on the defect by isolating the defective bit.
Information query
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