发明授权
- 专利标题: Examination-item-selection device, an examination-item-selection method, and an examination-item-selection program
- 专利标题(中): 检查项目选择装置,检查项目选择方法和检查项目选择程序
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申请号: US11859926申请日: 2007-09-24
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公开(公告)号: US08315883B2公开(公告)日: 2012-11-20
- 发明人: Yasuo Sakurai , Shigeharu Ohyu , Takuzo Takayama , Mariko Shibata
- 申请人: Yasuo Sakurai , Shigeharu Ohyu , Takuzo Takayama , Mariko Shibata
- 申请人地址: JP Tokyo JP Otawara-shi
- 专利权人: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- 当前专利权人: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- 当前专利权人地址: JP Tokyo JP Otawara-shi
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2006-259334 20060925
- 主分类号: G06Q10/00
- IPC分类号: G06Q10/00
摘要:
An examination-item database storing a plurality of types of examination items capable of examining a predetermined disease and attributes of these examination items so as to correspond to one another is prepared, the degree of risk for the predetermined disease is calculated based on individual physical information, a criterion for selection of an examination item for examining the predetermined disease is generated in accordance with the calculated degree of risk, and an examination item having an attribute meeting the selection criterion is searched out from the examination-item database. In addition, the calculated degree of risk and the examination-item database are displayed so as to correspond to the predetermined disease. This makes it possible to perform the optimal examination for each individual in accordance with the degree of risk, thereby improving the efficiency of detection of a disease. Moreover, reduction of superfluous examinations makes it possible to reduce physical and psychological burdens imposed on a patient by examinations.
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