Invention Grant
- Patent Title: Estimating a quantum state of a quantum mechanical system
- Patent Title (中): 估计量子力学系统的量子态
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Application No.: US12371941Application Date: 2009-02-17
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Publication No.: US08315969B2Publication Date: 2012-11-20
- Inventor: Martin Roetteler
- Applicant: Martin Roetteler
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Agent Joseph Kolodka
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06N7/02

Abstract:
A method includes performing quantum state tomography from the statistics of a collection of measurements, each of which has only two possible outcomes and has the feature of being a measurement of a single qubit. By carefully choosing the measurements it becomes possible to infer the state of a quantum system from the statistics. Moreover, the function which computes the state from the measurement statistics can be computed efficiently in the dimension of the underlying system. Reconstructing the quantum state is performed in accordance with the following expression: ρ = ( 2 d ∑ i = 1 d 2 - 1 p i P i + ( 1 - p i ) ( 1 - P i ) ) - ( d 2 - 2 d ) I d , where d is the dimension of the quantum mechanical system, ρ is the state of the quantum mechanical system, Id denotes the identity operator, Pi is one of the plurality of measurement projectors, and pi is the probability for the measurement projector Pi.
Public/Granted literature
- US20100094796A1 QUANTUM STATE TOMOGRAPHY WITH YES/NO MEASUREMENTS Public/Granted day:2010-04-15
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