Invention Grant
- Patent Title: Measuring device including a layer of a magnetoelastic alloy and a method for production thereof
- Patent Title (中): 包括磁弹性合金层的测量装置及其制造方法
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Application No.: US12282352Application Date: 2007-02-14
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Publication No.: US08316724B2Publication Date: 2012-11-27
- Inventor: Hans Ling , Håkan F. Wintzell , Mingsheng Wang , Per S. Gustafsson , Andrius Miniotas
- Applicant: Hans Ling , Håkan F. Wintzell , Mingsheng Wang , Per S. Gustafsson , Andrius Miniotas
- Applicant Address: SE Västerås
- Assignee: ABB, AB
- Current Assignee: ABB, AB
- Current Assignee Address: SE Västerås
- Agency: Venable LLP
- Agent Eric J. Franklin
- Priority: SE0600543 20060310
- International Application: PCT/SE2007/050088 WO 20070214
- International Announcement: WO2007/106024 WO 20070920
- Main IPC: G01L3/00
- IPC: G01L3/00
Abstract:
A measuring device including a layer of a magnetoelastic alloy formed on a load-carrying member. The layer is intended for measuring stresses induced by a force applied to the load-carrying member. An average grain size of the layer is in the range of 100 nm to 10000 nm. A method for production of the layer.
Public/Granted literature
- US20090249893A1 MEASURING DEVICE INCLUDING A LAYER OF A MAGNETOELASTIC ALLOY AND A METHOD FOR PRODUCTION THEREOF Public/Granted day:2009-10-08
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