发明授权
- 专利标题: Mass spectrometry apparatus and method using the apparatus
- 专利标题(中): 质谱装置及使用该装置的方法
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申请号: US12785119申请日: 2010-05-21
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公开(公告)号: US08319178B2公开(公告)日: 2012-11-27
- 发明人: Naoki Murakami
- 申请人: Naoki Murakami
- 申请人地址: JP
- 专利权人: Fujifilm Corporation
- 当前专利权人: Fujifilm Corporation
- 当前专利权人地址: JP
- 代理机构: Studebaker & Brackett PC
- 代理商 Donald R. Studebaker
- 优先权: JP2009/123919 20090522
- 主分类号: H01J49/16
- IPC分类号: H01J49/16 ; H01J49/40
摘要:
A mass-spectrometry apparatus includes a substrate for mass spectrometry used in surface-assisted laser desorption/ionization mass spectrometry, a light irradiation means that irradiates sample S in contact with a surface of the substrate with measurement light L1 to desorb analyte R in sample S from the surface, a metal probe that generates near-field light at the leading end thereof by irradiation with measurement light L1, a detector that detects desorbed analyte Ri, and an analysis means that performs mass spectrometry on analyte R based on a detection result by the detector. The leading end of the metal probe is arranged in such a manner that the near-field light generated by irradiation with measurement light L1 is in contact with a measurement light irradiation portion of sample S. The metal probe is arranged, with respect to the measurement light irradiation portion, at a position different from the direction of the detector.
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