发明授权
- 专利标题: Method and system for compensating temperature readings from a temperature sensing crystal integrated circuit
- 专利标题(中): 用于补偿温度感应晶体集成电路的温度读数的方法和系统
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申请号: US13085407申请日: 2011-04-12
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公开(公告)号: US08321169B2公开(公告)日: 2012-11-27
- 发明人: Todd Brooks , Vinay Chandrasekhar , Josephus Van Engelen , Jared Welz
- 申请人: Todd Brooks , Vinay Chandrasekhar , Josephus Van Engelen , Jared Welz
- 申请人地址: US CA Irvine
- 专利权人: Broadcom Corporation
- 当前专利权人: Broadcom Corporation
- 当前专利权人地址: US CA Irvine
- 代理机构: Thomas | Horstemeyer, LLP
- 主分类号: G01K15/00
- IPC分类号: G01K15/00 ; G06F19/00
摘要:
Aspects of a method and system for compensating temperature readings from a temperature sensing crystal integrated circuit are provided. An electronic device may digitize a temperature indication received from a temperature sensing circuit, digitize one or more calibration voltages received from said temperature sensing circuit, and calculate a compensated temperature indication utilizing the digitized calibration voltage(s), and the digitized temperature indication, and data from a table that characterizes behavior of the temperature sensing circuit as a function of temperature. One or more circuits in the electronic device may be controlled based on the compensated temperature indication. The compensated temperature indication may compensate for a gain error and/or offset error of a digital to analog converter that digitizes the temperature indication and the calibration voltage(s). There may be two calibration voltages.
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