发明授权
- 专利标题: Scanning probe microscope
- 专利标题(中): 扫描探针显微镜
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申请号: US12864491申请日: 2008-01-24
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公开(公告)号: US08321960B2公开(公告)日: 2012-11-27
- 发明人: Takeshi Ito
- 申请人: Takeshi Ito
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: DLA Piper LLP (US)
- 国际申请: PCT/JP2008/000078 WO 20080124
- 国际公布: WO2009/093284 WO 20090730
- 主分类号: G01Q20/02
- IPC分类号: G01Q20/02
摘要:
A portion of light emitted from a laser source (11) for detecting a displacement of a cantilever (4) is extracted by a half mirror (20) and guided onto a photodetector (21) having a light-receiving surface divided into four sections. When the direction of the emitted light is inclined due to a change in the ambient temperature or other factors, the light spot formed on the light-receiving surface of the photodetector (21) moves. Accordingly, the amount and direction of the inclination of the emission direction can be recognized from the amount and direction of the movement of the light spot. A drive amount calculator (22) calculates a drive amount according to the amount and direction of the inclination, and operates an actuator (23) to rotate the laser source (11) around each of the Y and Z axes. This operation compensates for the inclination of the direction of the emitted light and thereby prevents the inclination from being falsely recognized as an irregularity on the sample surface.
公开/授权文献
- US20110113515A1 Scanning Probe Microscope 公开/授权日:2011-05-12
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