Invention Grant
- Patent Title: Image defect detection
- Patent Title (中): 图像缺陷检测
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Application No.: US12566334Application Date: 2009-09-24
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Publication No.: US08326079B2Publication Date: 2012-12-04
- Inventor: Marie Vans , Sagi Schein , Carl Staelin
- Applicant: Marie Vans , Sagi Schein , Carl Staelin
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Disclosed is a computer implemented method of detecting a defect in a printed image, the method comprising the steps of: receiving a target image comprising digital image data representing a scan of the printed image; receiving a reference image comprising digital image data representing a reference of the printed image; calculating a structural dissimilarity measure, D, associated with a target pixel located in the target image and a reference pixel located in the reference image; and, determining on the basis of the structural dissimilarity measure whether a defect is present at the target pixel, wherein the structural dissimilarity measure is calculated using a structural measure, s, and a contrast measure, c; the structural measure calculated using a spatial cross-correlation associated with a target region, {right arrow over (x)}, containing the target pixel and a reference region, {right arrow over (y)}, containing the reference pixel, and the contrast measure calculated using a standard deviation associated with the target region, and a standard deviation associated with the reference region.
Public/Granted literature
- US20110069894A1 IMAGE DEFECT DETECTION Public/Granted day:2011-03-24
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