发明授权
- 专利标题: Foreign substance inspection apparatus, exposure apparatus, and method of manufacturing device
- 专利标题(中): 异物检查装置,曝光装置及其制造方法
-
申请号: US12871368申请日: 2010-08-30
-
公开(公告)号: US08330949B2公开(公告)日: 2012-12-11
- 发明人: Atsushi Kawahara
- 申请人: Atsushi Kawahara
- 申请人地址: JP
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP
- 代理机构: Rossi, Kimms & McDowell LLP
- 优先权: JP2009-201084 20090831
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N15/02
摘要:
A foreign substance inspection apparatus includes a light projecting unit, a detector which detects the intensity of scattered light of light projected onto the surface of an object to be detected by the light projecting unit, in association with the two-dimensional coordinate position on the surface, and a processing unit. The relationship between the intensity of the scattered light detected by the detector and the particle size of the foreign substance differs depending on the two-dimensional coordinate position on the surface. The processing unit determines, a conversion curve to convert the intensity of the scattered light detected by the detector into the particle size of the foreign substance, in accordance with the two-dimensional coordinate position of the foreign substance detected by the detector, and converts the intensity of the scattered light detected by the detector into the particle size of the foreign substance using the determined conversion curve.
公开/授权文献
信息查询