发明授权
- 专利标题： Sample processing apparatus and sample information display apparatus
- 专利标题（中）： 样品处理装置和样品信息显示装置
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申请号： US12606760申请日： 2009-10-27
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公开(公告)号： US08333123B2公开(公告)日： 2012-12-18
- 发明人: Hiroo Tatsutani , Hiroyuki Tanaka
- 申请人： Hiroo Tatsutani , Hiroyuki Tanaka
- 申请人地址： JP Hyogo
- 专利权人： Sysmex Corporation
- 当前专利权人： Sysmex Corporation
- 当前专利权人地址： JP Hyogo
- 代理机构： Sughrue Mion, PLLC
- 优先权： JP2008-277438 20081028; JP2009-043301 20090226
- 主分类号： G01N35/02
- IPC分类号： G01N35/02
摘要：
A sample processing apparatus comprising: a plurality of measuring units, each of which measures a sample; a sample conveyance unit for conveying a sample to at least one of the plurality of measurement units; a display unit; and a display controller for controlling the display unit to display an analysis result of a sample which the analysis result has been obtained based on the measurement by at least one of the plurality of measurement units, and controlling the display unit to display conveyance status information indicating a conveyance status of the sample which analysis result has not been obtained yet based on the measurement by at least one of the plurality of measurement units, is disclosed. A sample information display apparatus is also disclosed.
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