发明授权
- 专利标题: Methods and apparatus for rapid imprint lithography
- 专利标题(中): 快速压印光刻的方法和装置
-
申请号: US12795063申请日: 2010-06-07
-
公开(公告)号: US08333583B2公开(公告)日: 2012-12-18
- 发明人: Wei Zhang , Hua Tan , Stephen Y. Chou
- 申请人: Wei Zhang , Hua Tan , Stephen Y. Chou
- 申请人地址: US NJ Monmouth Junction
- 专利权人: Nanonex Corporation
- 当前专利权人: Nanonex Corporation
- 当前专利权人地址: US NJ Monmouth Junction
- 代理机构: Polster, Lieder, Woodruff & Lucchesi, L.C.
- 主分类号: B29C59/02
- IPC分类号: B29C59/02
摘要:
A mold for imprinting a patterned region by imprint lithography is provided with a peripheral groove around the patterned region. The groove is connected, as by channels through the mold, to a switchable source for gas removal to prevent bubbles and for the application of pressurized gas to separate the mold and substrate. In use, the mold is disposed adjacent the moldable surface and gas is withdrawn from the patterned region through the groove as the mold is pressed toward and into the moldable surface. At or near the end of the imprinting, the process is switched from removal of gas to the application of pressurized gas. The pressurized gas passes through the groove and separates or facilitates separation of the mold and the moldable surface.
公开/授权文献
- US20100247698A1 METHODS AND APPARATUS FOR RAPID IMPRINT LITHOGRAPHY 公开/授权日:2010-09-30
信息查询