发明授权
- 专利标题: Non-volatile semiconductor storage device
- 专利标题(中): 非易失性半导体存储器件
-
申请号: US13120987申请日: 2009-08-25
-
公开(公告)号: US08334551B2公开(公告)日: 2012-12-18
- 发明人: Kiyotaro Itagaki , Yoshihisa Iwata , Hiroyasu Tanaka , Masaru Kidoh , Ryota Katsumata , Masaru Kito , Hideaki Aochi , Akihiro Nitayama
- 申请人: Kiyotaro Itagaki , Yoshihisa Iwata , Hiroyasu Tanaka , Masaru Kidoh , Ryota Katsumata , Masaru Kito , Hideaki Aochi , Akihiro Nitayama
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2008-248350 20080926
- 国际申请: PCT/JP2009/065139 WO 20090825
- 国际公布: WO2010/035609 WO 20100401
- 主分类号: H01L29/792
- IPC分类号: H01L29/792 ; G11C11/34
摘要:
Each of the memory blocks includes: a first conductive layer expanding in parallel to the substrate over the first area, n layers of the first conductive layers being formed in a lamination direction and shared by the plurality of memory strings; a first semiconductor layer; and an electric charge accumulation layer. The memory strings are arranged with m columns in a second direction for each of the memory blocks. The wiring layers are arranged in the second direction, formed to extend to the vicinity of one end of the first conductive layer in the first direction from one side of the memory block, and connected via contact plugs to the first conductive layers. A relation represented by (Formula 1) is satisfied: (Formula 1) m>=n
公开/授权文献
- US20110175159A1 NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE 公开/授权日:2011-07-21
信息查询
IPC分类: