发明授权
- 专利标题: Shape measuring apparatus and shape measuring method
- 专利标题(中): 形状测量仪和形状测量方法
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申请号: US12901123申请日: 2010-10-08
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公开(公告)号: US08334985B2公开(公告)日: 2012-12-18
- 发明人: To Sho , Takashi Sakai , Daisuke Mitsumoto , Yasuhiro Ohnishi , Takeshi Kojima , Yasumoto Mori , Shree Nayar
- 申请人: To Sho , Takashi Sakai , Daisuke Mitsumoto , Yasuhiro Ohnishi , Takeshi Kojima , Yasumoto Mori , Shree Nayar
- 申请人地址: JP Kyoto
- 专利权人: OMRON Corporation
- 当前专利权人: OMRON Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Osha Liang LLP
- 主分类号: G01B11/24
- IPC分类号: G01B11/24 ; G06K9/36
摘要:
A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape being obtained by the shape calculating device using information on the distance obtained by the ranging device.
公开/授权文献
- US20120086950A1 SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD 公开/授权日:2012-04-12
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