Invention Grant
- Patent Title: Charged particle beam apparatus
- Patent Title (中): 带电粒子束装置
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Application No.: US12124666Application Date: 2008-05-21
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Publication No.: US08335397B2Publication Date: 2012-12-18
- Inventor: Atsushi Takane , Mitsuji Ikeda , Atsushi Kobaru
- Applicant: Atsushi Takane , Mitsuji Ikeda , Atsushi Kobaru
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2007-135916 20070522
- Main IPC: G06K9/40
- IPC: G06K9/40

Abstract:
In a method and apparatus for removing artifacts from an image generated a charged partial beam scanning device, a scanning method is determined, and the frequency of an artifact appearing on an image can then be determined, based on scanning method. A step 703, a frequency domain for removing an artifact can be determined from the vertical and horizontal widths determined by experimentation in advance with respect to the frequency position Photography is performed to obtain an image, which is Fourier transformed and the determined frequency domain is replaced, for example, by “0.” The resulting image is subjected to inverse Fourier transformation, and displayed and stored. The flow of such processing enables decreasing an artifact appearing on an image, depending on a scanning method. The frequency domain (vertical and horizontal widths) that is to be eliminated and a method for replacement by “0” are determined in advance, depending on the kind of inspected samples and a method can be selected depending on the kind of samples.
Public/Granted literature
- US20080292199A1 Charged Particle Beam Apparatus Public/Granted day:2008-11-27
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