Invention Grant
US08336002B2 IC design flow enhancement with CMP simulation 有权
IC设计流程增强与CMP模拟

IC design flow enhancement with CMP simulation
Abstract:
An integrated circuit (IC) design method includes providing IC design layout data; simulating a chemical mechanical polishing (CMP) process to a material layer based on the IC design layout, to generate various geometrical parameters; extracting resistance and capacitance based on the various geometrical parameters from the simulating of the CMP process; and performing circuit timing analysis based on the extracted resistance and capacitance.
Public/Granted literature
Information query
Patent Agency Ranking
0/0