发明授权
- 专利标题: Method of manufacturing semiconductor device with crystallized semiconductor film
- 专利标题(中): 制造具有结晶半导体膜的半导体器件的方法
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申请号: US11945891申请日: 2007-11-27
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公开(公告)号: US08338278B2公开(公告)日: 2012-12-25
- 发明人: Koichiro Tanaka , Takatsugu Omata
- 申请人: Koichiro Tanaka , Takatsugu Omata
- 申请人地址: JP Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Kanagawa-ken
- 代理机构: Nixon Peabody LLP
- 代理商 Jeffrey L. Costellia
- 优先权: JP2006-327584 20061204
- 主分类号: H01L21/20
- IPC分类号: H01L21/20
摘要:
To form a semiconductor film with a thickness of 50 nm or less, which includes a large grain crystal by totally melting the semiconductor film with a laser beam. A projection having a triangular cross section is formed on the surface of a semiconductor film. The shape of the projection is a conical shape or a triangular prismatic shape. A laser beam which has entered a projection of the semiconductor film travels toward a substrate while being greatly refracted and totally reflected at the interface between the projection and the air. Further, since the laser beam enters the semiconductor film from a projection, the laser beam which is incident on the interface between an insulating film and a semiconductor is very likely totally reflected. Thus, when a laser beam enters a semiconductor film from a projection, the time during which the laser beam propagates through the semiconductor film is longer, which can increase the absorptance of the semiconductor film.
公开/授权文献
- US20080131663A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE 公开/授权日:2008-06-05
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