Invention Grant
- Patent Title: Temperature measuring device and temperature measuring method
- Patent Title (中): 温度测量装置和温度测量方法
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Application No.: US12593811Application Date: 2008-03-25
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Publication No.: US08340468B2Publication Date: 2012-12-25
- Inventor: Yuichi Furukawa , Shingo Nakamura , Yuji Okada , Fumio Kawahara
- Applicant: Yuichi Furukawa , Shingo Nakamura , Yuji Okada , Fumio Kawahara
- Applicant Address: JP Toyota-shi JP Toyota-shi
- Assignee: Toyota Jidosha Kabushiki Kaisha,MEIWA e-TEC co., ltd.
- Current Assignee: Toyota Jidosha Kabushiki Kaisha,MEIWA e-TEC co., ltd.
- Current Assignee Address: JP Toyota-shi JP Toyota-shi
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-094122 20070330
- International Application: PCT/JP2008/056281 WO 20080325
- International Announcement: WO2008/120774 WO 20081009
- Main IPC: G06K9/32
- IPC: G06K9/32

Abstract:
Feature points (41, 42, 43) in the heat image (10) of a casting die (1) are extracted and a predetermined geometrical conversion processing is performed on the heat image (10) such that the feature points are superimposed on the reference feature points (61, 62, 63) set in a reference heat image (30) picked up previously to generate a corrected heat image (20). A difference image (40) is generated by superimposing the corrected heat image (20) and the reference heat image (30) such that the corrected feature points (51, 52, 53) in the corrected heat image (20) is superimposed on the corresponding reference feature points (61, 62, 63). With such an arrangement, a highly reliable difference image can be generated even when the imaging field of vision slips off among a plurality of heat images.
Public/Granted literature
- US20100098321A1 TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD Public/Granted day:2010-04-22
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