发明授权
- 专利标题: Method and apparatus for performing power supply self-diagnostics in redundant power architectures
- 专利标题(中): 用于在冗余电源架构中执行电源自诊断的方法和装置
-
申请号: US12571428申请日: 2009-09-30
-
公开(公告)号: US08340933B1公开(公告)日: 2012-12-25
- 发明人: Joseph P. King, Jr. , Phillip J. Roux , Michael A. Faulkner , Robert M. Beauchamp , Robert A. Guenther
- 申请人: Joseph P. King, Jr. , Phillip J. Roux , Michael A. Faulkner , Robert M. Beauchamp , Robert A. Guenther
- 申请人地址: US MA Hopkinton
- 专利权人: EMC Corporation
- 当前专利权人: EMC Corporation
- 当前专利权人地址: US MA Hopkinton
- 代理机构: Krishnendu Gupta
- 代理商 R. Kevin Perkins
- 主分类号: G01R31/36
- IPC分类号: G01R31/36
摘要:
A system for detecting latent defects within a redundant power architecture includes a plurality of redundant power supplies, each having one or more output power rails, connected in a redundant fashion to a system load; each power supply output having fault-isolating OR'ing circuitry that prevents reverse current flow when free of defects; each power supply having means for adjusting its output voltage; each power supply having means for monitoring an internal voltage therein, and, based on characteristics of the monitored internal voltage, determining the presence of latent defect/s in the fault-isolating “OR'ing” circuitry. Further, the system operates to shift the load demanded from power supplies in redundant power architectures to allow the power supplies to run at their optimum electrical efficiency.
信息查询