Invention Grant
- Patent Title: Method for fabricating a semiconductor device
- Patent Title (中): 半导体器件的制造方法
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Application No.: US12961410Application Date: 2010-12-06
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Publication No.: US08343841B2Publication Date: 2013-01-01
- Inventor: James A. Cooper , Xiaokun Wang
- Applicant: James A. Cooper , Xiaokun Wang
- Applicant Address: US IN West Lafayette
- Assignee: Purdue Research Foundation
- Current Assignee: Purdue Research Foundation
- Current Assignee Address: US IN West Lafayette
- Agency: Barnes & Thornburg LLP
- Main IPC: H01L21/331
- IPC: H01L21/331

Abstract:
A method for fabricating a semiconductor device includes forming a first semiconductor layer on a front side of the semiconductor substrate. Additional semiconductor layers may be formed on a font side of the first semiconductor layer. The substrate is subsequently removed. In some embodiments, one or more additional semiconductor layers may be formed on the back side of the first semiconductor layer after the semiconductor substrate has been removed. Additionally, in some embodiments, a portion of the first semiconductor layer is removed along with the semiconductor substrate. In such embodiments, the first semiconductor layer is subsequently etched to a known thickness. Source regions and device electrodes may be then be formed.
Public/Granted literature
- US20110151649A1 METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE Public/Granted day:2011-06-23
Information query
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