Invention Grant
- Patent Title: Memory and method for checking reading errors thereof
- Patent Title (中): 用于检查读取错误的存储器和方法
-
Application No.: US13456870Application Date: 2012-04-26
-
Publication No.: US08347185B2Publication Date: 2013-01-01
- Inventor: Wen-Chiao Ho , Chin-Hung Chang , Chun-Hsiung Hung , Kuen-Long Chang
- Applicant: Wen-Chiao Ho , Chin-Hung Chang , Chun-Hsiung Hung , Kuen-Long Chang
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Rabin & Berdo, P.C.
- Priority: TW95141200A 20061107
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F7/02 ; H03M13/00

Abstract:
A method for checking reading errors of a memory includes the following steps. A first data fragment is received. A first count index according to the first data fragment is generated, wherein the first count index is corresponding to a quantity of one kind of binary value in the first data fragment. The first data fragment is written into the memory. The first data fragment is read from the memory as a second data fragment. A second count index is generated according to the second data fragment. The first count index is compared with the second count index.
Public/Granted literature
- US20120210193A1 MEMORY AND METHOD FOR CHECKING READING ERRORS THEREOF Public/Granted day:2012-08-16
Information query