Invention Grant
- Patent Title: Topologies and methodologies for AMS integrated circuit design
- Patent Title (中): AMS集成电路设计的拓扑和方法
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Application No.: US11927720Application Date: 2007-12-11
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Publication No.: US08347244B2Publication Date: 2013-01-01
- Inventor: Amir Alon , David Goren , Rachel Gordin , Betty Livshitz , Sherman Anatoly , Michael Zelikson
- Applicant: Amir Alon , David Goren , Rachel Gordin , Betty Livshitz , Sherman Anatoly , Michael Zelikson
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A tool for analog and mixed signal circuits includes a unit enabling a user to identify one or more critical interconnect lines in a chip architecture and one or more selectable, predefined topologies for said critical interconnect lines. Each topology includes one or more signal wires and a current return path. A majority of the electric field lines are contained within the boundary of the topology. The invention also includes a method for designing analog and mixed signal (AMS) integrated circuits (IC), including defining a chip architecture and a floor plan, identifying one or more critical interconnect lines and selecting pre-designed transmission line topologies for the critical interconnect lines.
Public/Granted literature
- US20090150848A1 Topologies and Methodologies for AMS Integrated Circuit Design Public/Granted day:2009-06-11
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