Invention Grant
- Patent Title: Atom-interferometric, stepped gravity gradient measuring system
- Patent Title (中): 原子干涉仪,阶梯式重力梯度测量系统
-
Application No.: US12210852Application Date: 2008-09-15
-
Publication No.: US08347711B2Publication Date: 2013-01-08
- Inventor: Hugh F. Rice , Jack C. Lindell , Daniel J. DiFrancesco
- Applicant: Hugh F. Rice , Jack C. Lindell , Daniel J. DiFrancesco
- Applicant Address: US MD Bethesda
- Assignee: Lockheed Martin Corporation
- Current Assignee: Lockheed Martin Corporation
- Current Assignee Address: US MD Bethesda
- Agency: Kaplan, Breyer, Schwarz & Ottesen, LLP
- Main IPC: G01V7/00
- IPC: G01V7/00

Abstract:
A full-tensor, gravity gradient measuring system is disclosed that is based on atom interferometry. Each axis in the three-axis measuring system is served by a different gravity gradiometer, where each gradiometer comprises three pairs of atom interferometric (AI) accelerometers. The accelerometers in each pair are mounted on opposite sides of the gradiometer's rotation axis from each other. The three AI accelerometer pairs are step-rotated, instead of being continuously rotated, thereby providing enhanced signal-to-noise performance. The three gradiometers in the overall measuring system are mounted orthogonally with respect to one another on a local-level platform, in order to achieve a full-tensor measuring system. The measuring system can be step-rotated as an overall unit around an axis perpendicular to a local level reference. The multiple levels of stepped rotation, as enabled by the atom interferometry being utilized, yields improved results with lower costs than what is achievable with some prior-art techniques.
Public/Granted literature
- US20100064767A1 Atom-Interferometric, Stepped Gravity Gradient Measuring System Public/Granted day:2010-03-18
Information query