Invention Grant
- Patent Title: Specimen processing device and specimen processing method
- Patent Title (中): 样品处理装置和样品处理方法
-
Application No.: US12775866Application Date: 2010-05-07
-
Publication No.: US08347743B2Publication Date: 2013-01-08
- Inventor: Yuichi Hamada , Takaaki Nagai , Masaharu Shibata
- Applicant: Yuichi Hamada , Takaaki Nagai , Masaharu Shibata
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2009-112825 20090507; JP2009-177821 20090730
- Main IPC: B01L3/02
- IPC: B01L3/02

Abstract:
A specimen processing device comprising: first and second units for processing specimens; a conveyance unit for conveying a specimen rack in a first direction from a first position where the specimen is retrieved by the first unit to a second position where the specimen is retrieved by the second unit, and a second direction opposite to the first position; a detector common to the first and second units for executing a detection process with respect to the sample containers; and a conveyance controller controlling the conveyance unit to convey some sample containers of the detected sample containers executed with the detection process to the first position, and to convey the other sample containers of the detected sample containers to the second position, the some sample containers and the other sample containers being held by a common rack, is disclosed. A specimen processing method is also disclosed.
Public/Granted literature
- US20100282003A1 SPECIMEN PROCESSING DEVICE AND SPECIMEN PROCESSING METHOD Public/Granted day:2010-11-11
Information query
IPC分类: