发明授权
- 专利标题: Specimen processing device and specimen processing method
- 专利标题(中): 样品处理装置和样品处理方法
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申请号: US12775866申请日: 2010-05-07
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公开(公告)号: US08347743B2公开(公告)日: 2013-01-08
- 发明人: Yuichi Hamada , Takaaki Nagai , Masaharu Shibata
- 申请人: Yuichi Hamada , Takaaki Nagai , Masaharu Shibata
- 申请人地址: JP Kobe
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP Kobe
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: JP2009-112825 20090507; JP2009-177821 20090730
- 主分类号: B01L3/02
- IPC分类号: B01L3/02
摘要:
A specimen processing device comprising: first and second units for processing specimens; a conveyance unit for conveying a specimen rack in a first direction from a first position where the specimen is retrieved by the first unit to a second position where the specimen is retrieved by the second unit, and a second direction opposite to the first position; a detector common to the first and second units for executing a detection process with respect to the sample containers; and a conveyance controller controlling the conveyance unit to convey some sample containers of the detected sample containers executed with the detection process to the first position, and to convey the other sample containers of the detected sample containers to the second position, the some sample containers and the other sample containers being held by a common rack, is disclosed. A specimen processing method is also disclosed.
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