Invention Grant
- Patent Title: Sample holder, sample suction device using the same, and sample processing method
- Patent Title (中): 样品架,采样装置及样品处理方法
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Application No.: US12088669Application Date: 2006-09-28
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Publication No.: US08347744B2Publication Date: 2013-01-08
- Inventor: Takeshi Muneishi , Toshihiko Uemura , Katsuya Okumura
- Applicant: Takeshi Muneishi , Toshihiko Uemura , Katsuya Okumura
- Applicant Address: JP Kyoto JP Tokyo
- Assignee: Kyocera Corporation,Okutec Co., Ltd.
- Current Assignee: Kyocera Corporation,Okutec Co., Ltd.
- Current Assignee Address: JP Kyoto JP Tokyo
- Agency: DLA Piper (US) LLP
- Priority: JP2005-282975 20050928; JP2006-087622 20060328
- International Application: PCT/JP2006/319280 WO 20060928
- International Announcement: WO2007/037316 WO 20070405
- Main IPC: G01M19/00
- IPC: G01M19/00

Abstract:
Because a sample holder 100 is composed of a plurality of convex parts 1 provided on a top face of a base substance 2, and the plurality of convex parts 1 are spherical surfaces 1a formed of a single crystal or amorphous material, frictional wear of the sample at contact parts between a sample 4 and the convex parts 1 is reduced, thereby making it possible to inhibit particle generation. Further, because a joining layer 3 is formed of a single crystal or amorphous material, there is no defect that particles scattered on the sample holder 100 fill up it, which makes it possible to easily keep it in a clean state by cleaning, and it is possible to effectively reduce reattachment of particles to the sample 4.
Public/Granted literature
- US20090293647A1 Sample Holder, Sample Suction Device Using the Same, and Sample Processing Method Public/Granted day:2009-12-03
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