Invention Grant
- Patent Title: Counting inclusions in alloys by image analysis
- Patent Title (中): 通过图像分析计算合金中的夹杂物
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Application No.: US13126173Application Date: 2009-10-27
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Publication No.: US08347745B2Publication Date: 2013-01-08
- Inventor: William Beya , Marie Cuoco , Marie-Noelle Hinard , Beatrice Peltier
- Applicant: William Beya , Marie Cuoco , Marie-Noelle Hinard , Beatrice Peltier
- Applicant Address: FR Paris
- Assignee: SNECMA
- Current Assignee: SNECMA
- Current Assignee Address: FR Paris
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: FR0857268 20081027
- International Application: PCT/FR2009/052066 WO 20091027
- International Announcement: WO2010/049640 WO 20100506
- Main IPC: G01N33/00
- IPC: G01N33/00

Abstract:
A method of counting and analyzing an alloy by image analysis. The method includes a) preparing a sample of the alloy; b) determining inclusion detection thresholds by observation, with magnification, of at least one field of the sample; c) detecting inclusions of the sample as a function of the threshold defined in b), and counting the inclusions; d) acquiring images of each of the inclusions detected in c) and determining a size of each of the inclusions; e) determining the chemical composition of each of the detected inclusions by chemically analyzing each of them; and f) making a map of the sample from the images acquired in d), the map showing spatial distribution of the inclusions, in which each of the detected inclusions is represented by a graphics element, a size of the graphics element being proportional to the size of the inclusion, and a color of the graphics element being correlated to the chemical composition of the inclusion.
Public/Granted literature
- US20110204227A1 COUNTING INCLUSIONS IN ALLOYS BY IMAGE ANALYSIS Public/Granted day:2011-08-25
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