Invention Grant
- Patent Title: Object localization in X-ray images
- Patent Title (中): 对象定位在X射线图像
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Application No.: US12933915Application Date: 2009-03-20
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Publication No.: US08348507B2Publication Date: 2013-01-08
- Inventor: Niels Nijhof , Herman Stegehuis
- Applicant: Niels Nijhof , Herman Stegehuis
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08153526 20080328
- International Application: PCT/IB2009/051175 WO 20090320
- International Announcement: WO2009/118671 WO 20091001
- Main IPC: H05G1/02
- IPC: H05G1/02

Abstract:
An x-ray system (100) comprises a gantry (102) on which an x-ray source (104) and an x-ray detector (106) are mounted. A control unit (110) comprises means (114) for effectuating a wiggling motion of the gantry, wherein an axis (116) connecting the x-ray source and the x-ray detector traces a surface (128) of a cone (118). The x-ray source and the x-ray detector have a fixed position with respect to the axis. The control unit comprises means (120) for acquiring a series of x-ray images during the wiggling motion of the gantry. An object recognition unit (122) detects an object (124) appearing in the series of x-ray images to obtain a tracked path. A depth estimation unit (126) uses the tracked path for estimating a depth parameter indicative of a position of the object in a direction substantially parallel to the axis (116).
Public/Granted literature
- US20110026666A1 OBJECT LOCALIZATION IN X-RAY IMAGES Public/Granted day:2011-02-03
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