Invention Grant
- Patent Title: Wave ramp test method and apparatus
- Patent Title (中): 波形斜坡测试方法和装置
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Application No.: US12953683Application Date: 2010-11-24
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Publication No.: US08348508B2Publication Date: 2013-01-08
- Inventor: David J. Goodenough , Joshua R. Levy
- Applicant: David J. Goodenough , Joshua R. Levy
- Applicant Address: US NY Greenwich
- Assignee: The Phantom Laboratory, Incorporated
- Current Assignee: The Phantom Laboratory, Incorporated
- Current Assignee Address: US NY Greenwich
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Matthew Hulihan, Esq.
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
Method and apparatus are provided for use with a tomographic imaging device. A test object comprising a plurality of angled ramps may be provided to facilitate evaluating performance of the tomographic imaging device. A method for evaluating performance of a tomographic imaging device includes scanning the test object to produce a tomographic slice image and performing analysis on a waveform profile extracted from the image, to determine spatial performance of the tomographic imaging device. A tomographic imaging device may be provided comprising a scanning device and a data processing unit for performing a method of evaluating performance of the tomographic imaging device.
Public/Granted literature
- US20120128123A1 WAVE RAMP TEST METHOD AND APPARATUS Public/Granted day:2012-05-24
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