Invention Grant
- Patent Title: Polisher for chemical mechanical planarization
- Patent Title (中): 抛光机用于化学机械平面化
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Application No.: US11727119Application Date: 2007-03-23
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Publication No.: US08348719B2Publication Date: 2013-01-08
- Inventor: Hsin-Hsien Lu , Liang-Guang Chen , Tien-I Bao , Shau-Lin Shue
- Applicant: Hsin-Hsien Lu , Liang-Guang Chen , Tien-I Bao , Shau-Lin Shue
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: B24B49/00
- IPC: B24B49/00 ; B24B51/00 ; B24B1/00 ; B24B7/19 ; B24B7/30 ; C25F3/30

Abstract:
Embodiments of a polisher for chemical mechanical planarization. The polisher includes a polishing pad structure containing a first reactant therein, and a second reactant in a polishing environment over the polishing pad structure. The first reactant and the second reactant react endothermically upon contact when polishing a wafer surface between the polishing pad structure and the polishing environment.
Public/Granted literature
- US20080233839A1 Polisher for chemical mechanical planarization Public/Granted day:2008-09-25
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