Invention Grant
US08349512B2 Multi-MEA test station and multi-MEA test method using the same
失效
多MEA测试台和多MEA测试方法使用相同
- Patent Title: Multi-MEA test station and multi-MEA test method using the same
- Patent Title (中): 多MEA测试台和多MEA测试方法使用相同
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Application No.: US12014350Application Date: 2008-01-15
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Publication No.: US08349512B2Publication Date: 2013-01-08
- Inventor: Chan Gyun Shin
- Applicant: Chan Gyun Shin
- Applicant Address: KR Yongin, Gyeonggi-do
- Assignee: Samsung SDI Co., Ltd.
- Current Assignee: Samsung SDI Co., Ltd.
- Current Assignee Address: KR Yongin, Gyeonggi-do
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: KR10-2007-0016195 20070215
- Main IPC: H01M8/10
- IPC: H01M8/10 ; H01M8/04 ; G01R27/00

Abstract:
Disclosed is a multi-MEA test station capable of simultaneously testing and activating a plurality of MEAs and a multi-MEA test method using the same. The multi-MEA test station includes a chamber capable of receiving a plurality of MEAs; a first multi cell body including a first channel for supplying an oxidant to a cathode electrode of the MEA, and a second multi cell body including a second channel for supplying fuel to an anode electrode of the MEA; a pressing means closely adhering the first multi cell body, the second multi cell body and the MEA positioned therebetween by applying force in a direction that the first multi cell body and the second multi cell body are opposed to each other; a reactant supply means for supplying the oxidant to the first channel and supplying the fuel to the second channel; and a multi-loader controlling the environment of a test and activation on the plurality of MEAs and performing the test and the activation.
Public/Granted literature
- US20080197857A1 MULTI-MEA TEST STATION AND MULTI-MEA TEST METHOD USING THE SAME Public/Granted day:2008-08-21
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