Invention Grant
- Patent Title: Transitional interface between metal and dielectric in interconnect structures
- Patent Title (中): 互连结构中金属和电介质之间的过渡界面
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Application No.: US12823649Application Date: 2010-06-25
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Publication No.: US08349730B2Publication Date: 2013-01-08
- Inventor: Chien-Hsueh Shih , Shau-Lin Shue
- Applicant: Chien-Hsueh Shih , Shau-Lin Shue
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L23/52

Abstract:
An integrated circuit structure and methods for forming the same are provided. The integrated circuit structure includes a semiconductor substrate; a dielectric layer over the semiconductor substrate; an opening in the dielectric layer; a conductive line in the opening; a metal alloy layer overlying the conductive line; a first metal silicide layer overlying the metal alloy layer; and a second metal silicide layer different from the first metal silicide layer on the first metal silicide layer. The metal alloy layer and the first and the second metal silicide layers are substantially vertically aligned to the conductive line.
Public/Granted literature
- US20100267232A1 Transitional Interface Between Metal and Dielectric in Interconnect Structures Public/Granted day:2010-10-21
Information query
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