Invention Grant
- Patent Title: Electrical connection defect detection system and method
- Patent Title (中): 电气连接缺陷检测系统及方法
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Application No.: US12761456Application Date: 2010-04-16
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Publication No.: US08350575B2Publication Date: 2013-01-08
- Inventor: Su-Wei Tsai , Shang-Tsang Yeh
- Applicant: Su-Wei Tsai , Shang-Tsang Yeh
- Applicant Address: TW Taipei
- Assignee: Test Research, Inc.
- Current Assignee: Test Research, Inc.
- Current Assignee Address: TW Taipei
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Priority: TW98146546A 20091231
- Main IPC: G01R31/04
- IPC: G01R31/04

Abstract:
An electrical connection defect detection system to detect whether an electrical connection between an under-test pin of an under-test device and a signal line of a circuit board is normal is provided. The electrical connection defect detection system comprises a signal provider providing a test signal to the under-test pin through the signal line, a detection module, an electrode board and a plurality of grounding paths. The electrode board comprises a detection surface to be adapted to a surface of the under-test device opposite to the under-test pin to make the detection module detect a capacitance value associated with the electrode board, the under-test pin and the signal line larger than a threshold value when their connection is normal. The grounding paths are connected to one of not-under-test pin groups respectively to further connect to the ground potential. An electrical connection defect detection method is disclosed herein as well.
Public/Granted literature
- US20110156717A1 ELECTRICAL CONNECTION DEFECT DETECTION SYSTEM AND METHOD Public/Granted day:2011-06-30
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