A switching system for interfacing a single channel test equipment with a multi-channel device under test, the switching system including: an input connection for connecting to the single channel test equipment; an N-way switch having an N-way switch input coupled to the input connection, the N-way switch having N switch outputs; N output connections coupled to the N switch outputs, the N output connections for connecting to inputs of the multi-channel device under test; a controller coupled to the N-way switch for controlling a connection between the N-way switch input and one of the N switch outputs.