Invention Grant
- Patent Title: Test head positioning system and method
- Patent Title (中): 测头定位系统及方法
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Application No.: US12521470Application Date: 2007-12-26
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Publication No.: US08350584B2Publication Date: 2013-01-08
- Inventor: Charles P. Nappen , Christopher L. West , Steven J. Crowell
- Applicant: Charles P. Nappen , Christopher L. West , Steven J. Crowell
- Applicant Address: US NJ Mt. Laurel
- Assignee: inTEST Corporation
- Current Assignee: inTEST Corporation
- Current Assignee Address: US NJ Mt. Laurel
- Agency: RatnerPrestia
- International Application: PCT/US2007/026307 WO 20071226
- International Announcement: WO2008/085463 WO 20080717
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R31/00

Abstract:
An apparatus for supporting a device, comprising a base assembly, a plurality of carrier columns extending from the base unit, and a plurality of vertical support plates, each vertically movable along a respective carrier column and including a pivotal device mounting bracket. A pneumatic unit including a piston rod is associated with each vertical support plate such that vertical motion of the piston rod controls vertical motion of the respective vertical support plate.
Public/Granted literature
- US20100045323A1 TEST HEAD POSITIONING SYSTEM AND METHOD Public/Granted day:2010-02-25
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