Invention Grant
US08351034B2 Laminar flow width detecting method, laminar flow width control method, laminar flow control system, and flow cytometer
有权
层流流量检测方法，层流宽度控制方法，层流控制系统和流式细胞仪
- Patent Title: Laminar flow width detecting method, laminar flow width control method, laminar flow control system, and flow cytometer
- Patent Title (中): 层流流量检测方法，层流宽度控制方法，层流控制系统和流式细胞仪
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Application No.: US12328574Application Date: 2008-12-04
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Publication No.: US08351034B2Publication Date: 2013-01-08
- Inventor: Masataka Shinoda
- Applicant: Masataka Shinoda
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Priority: JPP2007-321543 20071213
- Main IPC: G01N15/02
- IPC: G01N15/02
Abstract:
The present invention provides a method for detecting the widths of a plurality of laminar layers formed in a channel includes performing at least the steps of: detecting optical information generated from a reference substance contained in a laminar flow; and calculating the width of the laminar flow, based on the optical information detected in the optical information detecting step.
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