Invention Grant
US08351047B2 Method for evaluating characteristics of optical modulator having high-precision Mach-Zehnder interferometers
有权
用于评估具有高精度马赫 - 曾德干涉仪的光学调制器特性的方法
- Patent Title: Method for evaluating characteristics of optical modulator having high-precision Mach-Zehnder interferometers
- Patent Title (中): 用于评估具有高精度马赫 - 曾德干涉仪的光学调制器特性的方法
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Application No.: US12921235Application Date: 2008-03-07
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Publication No.: US08351047B2Publication Date: 2013-01-08
- Inventor: Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- Applicant: Tetsuya Kawanishi , Shinya Nakajima , Satoshi Shinada
- Applicant Address: JP Tokyo
- Assignee: National Institute of Information and Communications Technology
- Current Assignee: National Institute of Information and Communications Technology
- Current Assignee Address: JP Tokyo
- Agency: Posz Law Group, PLC
- International Application: PCT/JP2008/000483 WO 20080307
- International Announcement: WO2009/110039 WO 20090911
- Main IPC: G01B9/02
- IPC: G01B9/02
Abstract:
ProblemAn object is to provide a method for evaluating characteristics of individual Mach-Zehnder (MZ) interferometers in an optical modulator which includes a plurality of MZ interferometers,Means for Solving ProblemsThe method comprises a step for adjusting a bias voltage of the MZ interferometer, a step for eliminating zero-order components, a step for measuring an output intensity and a step for evaluating characteristics. An optical modulator (1) includes the first MZ interferometer (2) and the second MZ interferometer (3). The first MZ interferometer (2) includes wave-branching section (5). Two arms (6,7), wave coupling section (8) and electrodes which is not shown in figures.
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