Invention Grant
- Patent Title: Interferometric device for position measurement and coordinate measuring machine
- Patent Title (中): 位置测量和坐标测量机的干涉仪
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Application No.: US12459751Application Date: 2009-07-07
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Publication No.: US08351049B2Publication Date: 2013-01-08
- Inventor: Hans-Artur Boesser , Siegfried Peter Kluge , Joerg Lenz , Gerhard Joseph Nickel
- Applicant: Hans-Artur Boesser , Siegfried Peter Kluge , Joerg Lenz , Gerhard Joseph Nickel
- Applicant Address: DE Weilburg
- Assignee: Vistec Semiconductor Systems GmbH
- Current Assignee: Vistec Semiconductor Systems GmbH
- Current Assignee Address: DE Weilburg
- Agency: Davidson, Davidson & Kappel, LLC
- Priority: DE102008002968 20080725
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
An interferometric device for position measurement of an element moveable in a plane is disclosed. A laser light source measures the position of the moveable element and emits the required measuring light. A beam splitter splits the measuring light into a first partial beam path and a second partial beam path, which each impinge on a reflecting surface of the moveable element via an interferometer. Herein, at least the beam splitter, which splits the measuring light into a first partial beam path and a second partial beam path, and the beam splitter, which directs the third partial beam path onto an etalon via an interferometer, have a respective beam trap associated with them, which traps the light returning from the respective interferometers.
Public/Granted literature
- US20100020332A1 Interferometric device for position measurement and coordinate measuring machine Public/Granted day:2010-01-28
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