Invention Grant
- Patent Title: Apparatus detecting a position of a functional layer on an electrode
- Patent Title (中): 设备检测电极上功能层的位置
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Application No.: US12829733Application Date: 2010-07-02
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Publication No.: US08351054B2Publication Date: 2013-01-08
- Inventor: So-Il Moon , Jee-Sang Hwang , Su-Hwan Kim
- Applicant: So-Il Moon , Jee-Sang Hwang , Su-Hwan Kim
- Applicant Address: KR
- Assignee: Samsung SDI Co., Ltd.
- Current Assignee: Samsung SDI Co., Ltd.
- Current Assignee Address: KR
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: KR10-2009-0105451 20091103
- Main IPC: G01B11/14
- IPC: G01B11/14

Abstract:
An apparatus detecting the position of the functional layer of the electrode plate includes a first electrode plate sensor disposed at a side of a material to sense start points of electrode plates continuously formed on the material at uniform intervals, a second electrode plate sensor disposed at an other side of the material to sense a length of the electrode plate, a functional layer sensor provided behind the first electrode plate sensor and the second electrode plate sensor above a material traveling direction to sense position and length of the functional layer formed on the electrode by sensing a difference in color, and a controller feeding back a feedback result indicating whether the functional layer is correctly coated through values sensed by the first electrode plate sensor, the second electrode plate sensor, and the functional layer sensor.
Public/Granted literature
- US20110102809A1 APPARATUS DETECTING A POSITION OF A FUNCTIONAL LAYER ON AN ELECTRODE Public/Granted day:2011-05-05
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