Invention Grant
US08351567B2 Method and system for the automated testing and/or measuring of a plurality of substantially identical components using X-ray radiation
有权
用于使用X射线辐射自动测试和/或测量多个基本上相同的组件的方法和系统
- Patent Title: Method and system for the automated testing and/or measuring of a plurality of substantially identical components using X-ray radiation
- Patent Title (中): 用于使用X射线辐射自动测试和/或测量多个基本上相同的组件的方法和系统
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Application No.: US12842652Application Date: 2010-07-23
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Publication No.: US08351567B2Publication Date: 2013-01-08
- Inventor: Michael Wuestenbecker , Ingo Stuke
- Applicant: Michael Wuestenbecker , Ingo Stuke
- Applicant Address: DE Huerth
- Assignee: GE Sensing & Inspection Technologies GmbH
- Current Assignee: GE Sensing & Inspection Technologies GmbH
- Current Assignee Address: DE Huerth
- Agency: Saliwanchik, Lloyd & Eisenschenk
- Priority: EP09009615 20090724
- Main IPC: G01N23/083
- IPC: G01N23/083 ; H05G1/02 ; A61B6/03

Abstract:
A method and system for automated testing and/or measurement of a plurality of substantially identical components by means of X-ray radiation comprises a testing/measuring device with an X-ray device, a protection cabin surrounding the testing/measuring device, a conveying device for continuously conveying components to or away from the testing/measuring device, and a control/evaluation unit, which is set up for automated control of the system and for evaluation of the X-ray signals. The testing/measuring device comprises a support and a rotor mounted on the support so as to be continuously rotatable, the X-ray device being arranged on the rotor and the conveying device being set up for serial conveying of the components through the rotor and the control/evaluation unit for computer tomographic evaluation of the X-ray signals.
Public/Granted literature
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