Invention Grant
US08351570B2 Phase grating used to take X-ray phase contrast image, imaging system using the phase grating, and X-ray computer tomography system
失效
相位光栅用于采取X射线相位对比图像,成像系统使用相位光栅和X射线计算机断层扫描系统
- Patent Title: Phase grating used to take X-ray phase contrast image, imaging system using the phase grating, and X-ray computer tomography system
- Patent Title (中): 相位光栅用于采取X射线相位对比图像,成像系统使用相位光栅和X射线计算机断层扫描系统
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Application No.: US12891891Application Date: 2010-09-28
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Publication No.: US08351570B2Publication Date: 2013-01-08
- Inventor: Takashi Nakamura , Aya Imada
- Applicant: Takashi Nakamura , Aya Imada
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2009-234850 20091009
- Main IPC: H05G1/60
- IPC: H05G1/60

Abstract:
To provide a phase grating capable of acquiring, in photographing of an X-ray phase contrast image by use of X-ray with two wavelengths, an X-ray phase contrast image by a phase grating in the same size as when a single wavelength is used, provided is a phase grating used when an X-ray is directed to take an X-ray phase contrast image, the phase grating including a periodic structure for generating a phase difference between an X-ray transmitted through the structure and an X-ray not transmitted through the structure. The periodic structure has different periods in a plurality of directions in a same surface.
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