发明授权
- 专利标题: Projection height measuring method, projection height measuring apparatus and program
- 专利标题(中): 投影高度测量方法,投影高度测量仪器和程序
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申请号: US12440664申请日: 2007-09-07
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公开(公告)号: US08351709B2公开(公告)日: 2013-01-08
- 发明人: Kenta Hayashi
- 申请人: Kenta Hayashi
- 申请人地址: JP Tokyo
- 专利权人: Dai Nippon Printing Co., Ltd.
- 当前专利权人: Dai Nippon Printing Co., Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2006-247276 20060912
- 国际申请: PCT/JP2007/067494 WO 20070907
- 国际公布: WO2008/032651 WO 20080320
- 主分类号: G06K9/46
- IPC分类号: G06K9/46
摘要:
A projection height measuring method measures the height of a projection having a conical shape, formed on the surface of a workpiece. The area having the projection is imaged at an angle of depression. A projection area is extracted by classifying an area in the image into a bright area, a dark area and an intermediate area. From these, an area composed of the bright area and the dark area indicates the projection area, and the intermediate area indicates the work area. The length of the bottom surface diameter the length of a generatrix of the projection area are determined. The height of the projection is calculated based on the two lengths and the angle of depression.
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