Invention Grant
- Patent Title: Projection height measuring method, projection height measuring apparatus and program
- Patent Title (中): 投影高度测量方法,投影高度测量仪器和程序
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Application No.: US12440664Application Date: 2007-09-07
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Publication No.: US08351709B2Publication Date: 2013-01-08
- Inventor: Kenta Hayashi
- Applicant: Kenta Hayashi
- Applicant Address: JP Tokyo
- Assignee: Dai Nippon Printing Co., Ltd.
- Current Assignee: Dai Nippon Printing Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-247276 20060912
- International Application: PCT/JP2007/067494 WO 20070907
- International Announcement: WO2008/032651 WO 20080320
- Main IPC: G06K9/46
- IPC: G06K9/46

Abstract:
A projection height measuring method measures the height of a projection having a conical shape, formed on the surface of a workpiece. The area having the projection is imaged at an angle of depression. A projection area is extracted by classifying an area in the image into a bright area, a dark area and an intermediate area. From these, an area composed of the bright area and the dark area indicates the projection area, and the intermediate area indicates the work area. The length of the bottom surface diameter the length of a generatrix of the projection area are determined. The height of the projection is calculated based on the two lengths and the angle of depression.
Public/Granted literature
- US20100040258A1 PROJECTION HEIGHT MEASURING METHOD, PROJECTION HEIGHT MEASURING APPARATUS AND PROGRAM Public/Granted day:2010-02-18
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