Invention Grant
- Patent Title: Manipulable aid for dimensional metrology
- Patent Title (中): 用于尺寸计量的人力辅助
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Application No.: US12621002Application Date: 2009-11-18
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Publication No.: US08352212B2Publication Date: 2013-01-08
- Inventor: William Fetter , Eric John Bennett , Wilhelmus Weekers , Gary W. Russell
- Applicant: William Fetter , Eric John Bennett , Wilhelmus Weekers , Gary W. Russell
- Applicant Address: US RI North Kingstown
- Assignee: Hexagon Metrology, Inc.
- Current Assignee: Hexagon Metrology, Inc.
- Current Assignee Address: US RI North Kingstown
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: G01B5/008
- IPC: G01B5/008
Abstract:
A manipulable aid which is separate and distinct from the probe of a CMM permits a CMM operator to more directly interact with a CMM measurement volume to align a workpiece, configure a measurement path, and/or program a dimensional metrology application.
Public/Granted literature
- US20110119025A1 MANIPULABLE AID FOR DIMENSIONAL METROLOGY Public/Granted day:2011-05-19
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