Invention Grant
US08352781B2 System and method for efficient detection and restoration of data storage array defects
有权
用于有效检测和恢复数据存储阵列缺陷的系统和方法
- Patent Title: System and method for efficient detection and restoration of data storage array defects
- Patent Title (中): 用于有效检测和恢复数据存储阵列缺陷的系统和方法
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Application No.: US12498143Application Date: 2009-07-06
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Publication No.: US08352781B2Publication Date: 2013-01-08
- Inventor: Akhil Garg , Prashant Dubey
- Applicant: Akhil Garg , Prashant Dubey
- Applicant Address: NL Amsterdam
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Amsterdam
- Agency: Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- Priority: IN1615/DEL/2008 20080704
- Main IPC: G06F11/16
- IPC: G06F11/16

Abstract:
The system and method are for efficient detection and restoration of data storage array defects. The system may include a data storage subsystem, wherein the data storage subsystem includes a data storage array, read-write logic coupled to the data storage array, a parity generator for producing and storing check data during write operations to the data storage array and generating check data during read operations on the data storage array, and a parity checker for verifying the stored check data with generated check data and identifying defective data read-write elements during read operations on the data storage array. The subsystem may further include a Built-in Self Test (BIST) generator operating only on the identified defective data read-write elements for determining defective data storage elements in the defective data read-write elements, and a restoration mechanism for restoring the valid operation of data access elements containing the defective data storage elements in the data storage array.
Public/Granted literature
- US20100017651A1 SYSTEM AND METHOD FOR EFFICIENT DETECTION AND RESTORATION OF DATA STORAGE ARRAY DEFECTS Public/Granted day:2010-01-21
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